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Numéro de sérieNB100ELT23LDR2
Description3.3V Dual Differential Lvpecl to LVTTL Translator
SociétéON Semiconductor
DatasheetTélécharger NB100ELT23LDR2 datasheet
  • Description courte

  • APPLICATION NOTE USAGE This application note provides a general overview of the AC characteristics that are specified on the ON Semiconductor data sheets for MECL 10HTM, 100H, ECLinPSTM, ECLinPS LiteTM, and GigaCommTM SiGe devices. Data sheet information takes precedence over this application note if there are differences. This application note includes the following information:· AC Test Bench Information· AC Characteristic Definitions· AC Characteristic Test Methods· AC Characteristic Examples· AC Characteristic Symbols· AC Characteristic References TABLE OF CONTENTS

    Lab Testing Test Bench Overview. 2 Test Initialization. 2 Test Bench Equipment. 3 AC Test Boards. 4 Signal Levels AC HIGH and LOW Levels. 5 Oscilloscope Averaging. 5 Input Levels. 5 Output Levels. 5 Output Swing. 6 Signal Timing Duty Cycle. 6 Maximum Input Frequency. 6 Differential Characteristics Differential Input Application. 7 Unused Output Termination. 7 Differential Crosspoint. 7 Input Voltage Swing. 7 Test Input Swing. 7

    Differential Characteristics (continued) Common Mode Range. 7 Differential Input Example. 8 Single-Ended Characteristics Single-Ended Inputs. 8 Single-Ended 50% Points. 8 Single­Ended Input Voltage Range. 8 Single­Ended Input Test Level. 8 Differential Inputs (Single­Ended Mode). 9 Timing Characteristics Output Rise and Fall Times. 9 Propagation Delay. 10 Skew (Duty Cycle). 11 Skew (Within Device). 11 Skew (Device to Device). 11 Minimum Input Pulse Width. 11 Setup and Hold Time. 12 Set and Reset Recovery Time. 14 Jitter Overview. 15 Random Jitter. 15 RJ Confidence Levels. 15 Total RJ Test Setup. 16 Test Equipment RJ Test Setup. 16 DUT RJ Calculation. 16 Deterministic Jitter. 17 Total DJ Test Setup. 17 Test Equipment DJ Test Setup. 18 DUT DJ Calculation. 18 Symbols and Acronyms Symbols and Acronyms Table. 19 References AC Characteristic References. 20

    · The test cables are connected from the DUT test board

    output connectors to the appropriate digital sampling oscilloscope input connectors.· The power supply cables are connected to the DUT test board power supply connectors.· The airflow regulator is set to 500 lfpm and the desired DUT ambient air temperature. The DUT is in this environment for a minimum of 3 minutes before testing begins. Data sheet specifications are typically given for -40°C, 25°C, and 85°C.

    Specialized test benches are used to determine the AC characteristics of the Device-Under-Test (DUT). A typical test bench setup for a differential device is shown in Figure 1.

    · The test cables are connected from the pulse generator to


    AC characterization equipment is carefully selected to ensure that the test equipment is suitable for the devices to be tested, and that the measurements are accurate and repeatable. For example, sampling head bandwidth

    must be wide enough for accurate rise and fall time measurements. The test equipment that is currently used by ON Semiconductor is listed in Table 1. Further information on the test equipment can be found at the respective manufacturer's website.

    Test Equipment Digital Sampling Oscilloscope Manufacturer/Model Tektronix SD24/26 20 GHz Module Tektronix 80E03 20 GHz Module 80E01 50 GHz Module Equipment Notes Customers can use lower performance equipment for evaluation, but may not be able to duplicate all of ON Semiconductor measurements (e.g., rise/fall and propagation delay times). Customers can use lower performance equipment for evaluation, but may not be able to duplicate all of ON Semiconductor measurements (e.g., rise/fall and propagation delay times). Note that the 50 GHz sampling module is required for GigaComm devices as they typically have rise and fall times between 20 ps and 50 ps. Maximum pulse frequency of 630 MHz. Maximum pulse frequency of 3.0 GHz. Maximum pulse frequency of 12 GHz. Used to supply VCC, VEE, and specialized bias voltages. Low-resistance supply voltage connections and RF quality supply filter capacitors are designed into the AC test boards that are used to mount the DUT. High bandwidth, low-loss matched cables are used to ensure accurate measurements. Each cable of an input/output cable pair is the same length and has a characteristic impedance of 50 ohms. Establishes the DUT ambient temperature.